Instrumentation
Ensure that all necessary training is complete prior to reserving instrumentation in ICAL. If you are unsure what training you need, please reach out to ical@sympa.montana.edu for assistance.
Current Instrumentation
Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)
IONTOF GmbH, model IV
- Mass resolution of around 5,000 m/∆m (~ 0.00x amu) and spatial resolution of ~ 1 µm
- Mass range of 0-10,000 amu
- Trace element detection limits in ppm range
- Seamless positive and negative ion imaging modes
- Large sample loading area can accommodate up to 8-inch wafers
- Sub-micron imaging to map any mass number of interest
- Allows retrospective analysis with data cube giving full mass spectrum from every pixel
Manufacturer's website:
Field Emission Scanning Electron Microscopes (FE SEM)
Zeiss SUPRA 55VP and Zeiss Ultra 55
- Dual FE-SEMs to give in-depth analysis of varied samples from biological to geological systems
- Ultra-high resolution at low accelerating voltage to allow nanometer scale imaging
- Large area and fast EBSD and EDS mapping with state-of-the art Oxford Detectors (Symmetry and Ultim Max, respectively).
- Variable pressure and high vacuum modes available
- Large volume sample analysis chamber
- Backscatter and secondary electron imaging and InLens detector
- Cathodoluminescence imaging with state-of-the-art Delmic system
Manufacturers' websites:
Pella Carbon Coater for SEM sample prep
108 Carbon Coater
- High quality desktop vacuum coating systems
- 108 series sputter coaters for standard SEM and EDS sample coating
- Its dedicated thickness measurement system offers tight controls to create the desired coating thickness
- Better and more uniform coating on topographic samples
- Easy to use
- MORE INFORMATION »
Bruker D8 Advance Powder X-ray Diffractometer
D8 Advance
- Features a unique D8 diffractometer family platform, perfect for all X-ray powder diffraction and scattering application
- In addition, there is a pair distribution function for analysis
- The D8 Advance is also adaptable in its measuring and can measure any sample type from liquids, solid blocks, loose powders, and thin films
- MORE INFORMATION »
Oxford Cypher Atomic Force Microscope (AFM)
Cypher AFM (with Blue Drive)
- Imaging of conducting and non-conducting surfaces
- Sub-nanometer resolution
- Imaging in air and liquid, allowing in-situ measurements and real time imaging of biological and chemical processes
- AFM can be used to measure and localize many different forces including: adhesion strength, magnetic forces and mechanical properties
- True 3D imaging and measurements
- Magnetic, friction, chemical, and phase imaging
- MORE INFORMATION »
X-ray Photoelectron Spectrometer (XPS)
Physical Electronics 5600 (Not Available as of 2022)
- Elemental identification and quantification
- Chemical functional group identification and quantification
- Chemical state imaging
- Surface sensitivity
- Layer-by-layer depth profiling
- Minimal sample damage
- Analysis of insulating and conducting samples
- Data collection / stage automation
- Cold stage
- MORE INFORMATION »
Scanning Auger Electron Nanoprobe (AES)
Physical Electronics 710
- Rapid sample introduction
- Low-Z elemental detection
- Quantitative analysis, mapping, linescan for AES and EDS
- Surface sensitivity of 1-5 nm
- Enhanced lateral spatial resolution for elemental analysis (<8 nm with a 20kV, 1nA electron beam )
- Limited chemical information
- Sputter depth profiling (three dimensional analysis)
- High resolution secondary electron imaging of analysis area
- MORE INFORMATION »
Epifluorescence Optical Microscope
OLYMPUS BX-61 (Not Available as of 2020)
- Precision objectives including air, oil and water immersion objectives
- Suite of reflected (fluorescent) filters (DAPI, FITC/CY2, TRITC/CY3, triple band and RBF)
- Significantly reduced autofluorescence and signal-to-noise ratio
- DIC imaging (10x, 20x, 40x, 60x)
- Digital camera imaging for still and time-lapse observations
- MORE INFORMATION »
Critical Point Dryer (CPD)
Tousimis SAMDRI-795
- Alternative to air drying for vacuum samples
- Reduces imaging artifacts
- Uses liquid CO2
- MORE INFORMATION »
Metal Coaters for SEM sample prep
Emitech K575X peltier cooled metal coaters
- For sputter coating samples for SEM prep with metal conductive layer
- Two coaters: Dual source and dedicated source with interchangeable metal targets
- Dual source coater can provide alternating metal layers
- Adjustable current and time settings to give controlled layer thicknesses of 10-20 nm
- Available targets are iridium, gold, silver, platinum, and gold palladium to different applications
Manufacturer's website:
Video Contact Angle System
VCA 3500XE - ASC Products
- Provides contact angle measurement
- Determines surface energy
- Hydrophilicity/hydrophobicity of surfaces
- Gives information on surface cleanliness, roughness, etc.
Manufacturer's website:
Zeta Potential Meter
Zeta-meter 4.0
- Provides indirect measure of the net charge on a nanoparticle
- Zeta potential values are determined via electrophoretic mobility measurements
- Obtains zeta potential values of nanoparticles in aqueous solution
- Gives criteria for the tendency of particles to flocculate (aggregate)
Manufacturer's website:
