Sample Preparation Lab(prepLab)

The Sample Preparation Facility (prepLab) is a new, high-precision sample preparation facility – located in 329 Cobleigh Hall. This facility allows preparation of ultra-high quality polished specimens for SEM, TEM, EDX, nano-Auger, EBSD and other microbeam analysis requiring flat, smooth, and damage-free surfaces. 

For the Sample Preparation Lab click here.

Current Instrumentation

Alex with IONTOF ToF-SIMS Instrument

Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

IONTOF GmbH, model IV

  • Mass resolution of 0.00x amu and spatial resolution of approx. 1 µm
  • Mass range of 0-10,000 amu
  • Trace element detection limits in ppm range
  • Seamless positive and negative ion imaging modes
  • Large sample loading area can accommodate up to 8-inch wafers
  • Sub-micron imaging to map any mass number of interest
  • Allows retrospective analysis with data cube giving full mass spectrum from every pixel

Manufacturer's website:

Zeiss FESEM Instrument in ICAL

Field Emission Scanning Electron Microscopes (FE SEM)

Zeiss SUPRA 55VP and Zeiss Ultra 55

  • Dual FE-SEMs to give in-depth analysis of varied samples from biological to geological systems
  • Ultra-high resolution at low accelerating voltage to allow nanometer scale imaging 
  • Large area and fast EBSD and EDS mapping with state-of-the art Oxford Detectors (Symmetry and Ultim Max, respectively).
  • Electron beam lithography capability
  • Variable pressure and high vacuum modes available
  • Large volume sample analysis chamber
  • Backscatter and secondary electron imaging and InLens detector
  • Cathodoluminescence imaging with state-of-the-art Delmic system

Manufacturers' websites:

Carbon Coater in ICAL

Pella Carbon Coater for SEM sample prep

108 Carbon Coater

  • High quality desktop vacuum coating systems
  • 108 series sputter coaters for standard SEM and  EDS sample coating
  • Its dedicated thickness measurement system offers tight controls to create the desired coating thickness
  • Better and more uniform coating on topographic samples
  • Easy to use
  • MORE INFORMATION »
X-ray Diffraction Instrument in ICAL

Bruker D8 Advance Powder X-ray Diffractometer

D8 Advance

  • Features a unique D8 diffractometer family platform, perfect for all X-ray powder diffraction and scattering application
  • In addition, there is a pair distribution function for analysis
  • The D8 Advance is also adaptable in its measuring and can measure any sample type from liquids, gases, loose powders, and thin films
  • MORE INFORMATION »
Photo of Atomic Force Microscope

Oxford Cypher Atomic Force Microscope (AFM)

Cypher AFM (with Blue Drive)

  • Imaging of conducting and non-conducting surfaces
  • Sub-nanometer resolution
  • Imaging in air and liquid, allowing in-situ measurements and real time imaging of biological and chemical processes
  • AFM can be used to measure and localize many different forces including: adhesion strength, magnetic forces and mechanical properties
  • True 3D imaging and measurements
  • Magnetic, friction, chemical, and phase imaging
  • MORE INFORMATION »

 

Photo of instrument X-ray Photoelectron Spectrometer

X-ray Photoelectron Spectrometer (XPS)

Physical Electronics 5600 (Not Available 2022)
  •  Elemental identification and quantification
  • Chemical functional group identification and quantification
  • Chemical state imaging
  • Surface sensitivity
  • Layer-by-layer depth profiling
  • Minimal sample damage
  • Analysis of insulating and conducting samples
  • Data collection / stage automation
  • Cold stage
  • MORE INFORMATION »

 

Photo of Scanning Auger Electron Nanoprobe

Scanning Auger Electron Nanoprobe (AES)

Physical Electronics 710
  •  Rapid sample introduction
  • Low-Z elemental detection
  • Quantitative analysis, mapping, linescan for AES and EDS
  • Surface sensitivity of 1-5 nm
  • Enhanced lateral spatial resolution for elemental analysis (<8 nm with a 20kV, 1nA electron beam )
  • Limited chemical information
  • Sputter depth profiling (three dimensional analysis)
  • High resolution secondary electron imaging of analysis area
  • MORE INFORMATION »

 

Photo of Epifluorescence Optical Microscope

Epifluorescence Optical Microscope

OLYMPUS BX-61 (Not Available 2020)
  •  Precision objectives including air, oil and water immersion objectives
  • Suite of reflected (fluorescent) filters (DAPI, FITC/CY2, TRITC/CY3, triple band and RBF)
  • Significantly reduced autofluorescence and signal-to-noise ratio
  • DIC imaging (10x, 20x, 40x, 60x)
  • Digital camera imaging for still and time-lapse observations
  • MORE INFORMATION »

 

Photo of Critical Point Dryer

Critical Point Dryer (CPD)

Tousimis SAMDRI-795
  •  Alternative to air drying for vacuum samples
  • Reduces imaging artifacts 
  • Uses liquid CO2
  • MORE INFORMATION »
metal coaters

Metal Coaters for SEM sample prep

Emitech K575X peltier cooled metal coaters 
  • For sputter coating samples for SEM prep with metal conductive layer 
  • Two coaters: Dual source and dedicated source with interchangeable metal targets 
  • Dual source coater can provide alternating metal layers 
  • Adjustable current and time settings to give controlled layer thicknesses of 10-20 nm 
  • Available targets are iridium, gold, silver, platinum, and gold palladium to different applications 

Manufacturer's website:

video contact angle system

Video Contact Angle System

VCA 3500XE - ASC Products
  • Provides contact angle measurement
  • Determines surface energy
  • Hydrophilicity/hydrophobicity of surfaces
  • Gives information on surface cleanliness, roughness, etc.

Manufacturer's website:

zeta potential meter

Zeta Potential Meter

Zeta-meter 4.0
  • Provides indirect measure of the net charge on a nanoparticle
  • Zeta potential values are determined via electrophoretic mobility measurements
  • Obtains zeta potential values of nanoparticles in aqueous solution
  • Gives criteria for the tendency of particles to flocculate (aggregate)

Manufacturer's website: