The Zeiss Field Emission SEM is unique in that it can examine surfaces down to the nanometer scale. This is either done through high vacuum or with the Variable Pressure (VP) model. This SEM also features an Energy Dispersive x-ray Spectrometer (EDS), an Electron BackScattered Diffraction (EBSD) system, and a Nanometer Pattern Generation System (NPGS).

In summary, the SEM system can provide the following:

  • High resolution 

  • Elemental mapping and analysis of material in bulks
  • Fast sample introductions and elemental mapping 

  • Data analysis of topographies and other information

  • Quick detection of trace element content, even in small doses

  • Analysis and imaging of samples in their unaltered state

  • An oil-free vacuum

  • Capacity for both small and large samples or specimens